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Filament of Lightbulb viewed by Scanning Electron Microscopy - SEM
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FAILURE ANALYSIS
FAILURE ANALYSIS EXAMPLES
1.)A motorcycle was involved in an automobile accident that occurred after dark. EMSL was asked to determine if the headlight of the motorcycle was on or off at the time of the accident. EMSL examined the filament of the smashed headlight and found, with Scanning Electron Microscopy (SEM) and X-Ray Microanalysis (EDX), the presence of microscopic glass fragments bound to the filament, thus proving that the filament was hot at the time of the accident.
2.) An automobile was involved in an accident and the driver claimed that he could not stop. Upon inspection by a mechanic it was determined that the brake shoes may have been faulty. EMSL was asked to analyze the brakes. Extensive testing with Scanning Electron Microscopy revealed cracks and pores within the pads that were not within the tolerance limits for brake shoes. These defects caused the collapse of the brakes.
3.) A comupter corporation was having problems with computer failures. After careful analysis by Scanning Electron Microscopy, we were able to determine the failure on the semiconductor due to manufacturing problems.
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